As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://traditional-odia-food53950.corpfinwiki.com/9571912/low_power_design_as_a_core_competency_in_modern_vlsi_engineering